| 000 | 01740cam a2200301zu 4500 | ||
|---|---|---|---|
| 001 | 88965805 | ||
| 003 | FRCYB88965805 | ||
| 005 | 20250429184050.0 | ||
| 006 | m o d | ||
| 007 | cr un | ||
| 008 | 250429s2021 fr | o|||||0|0|||eng d | ||
| 020 | _a9781785481543 | ||
| 035 | _aFRCYB88965805 | ||
| 040 |
_aFR-PaCSA _ben _c _erda |
||
| 100 | 1 | _aVanzi, Massimo | |
| 245 | 0 | 1 |
_aAdvanced Laser Diode Reliability _c['Vanzi, Massimo', 'Bechou, Laurent', 'Fukuda, Mitsuo'] |
| 264 | 1 |
_bISTE Press - Elsevier _c2021 |
|
| 300 | _a p. | ||
| 336 |
_btxt _2rdacontent |
||
| 337 |
_bc _2rdamdedia |
||
| 338 |
_bc _2rdacarrier |
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| 650 | 0 | _a | |
| 700 | 0 | _aVanzi, Massimo | |
| 700 | 0 | _aBechou, Laurent | |
| 700 | 0 | _aFukuda, Mitsuo | |
| 856 | 4 | 0 |
_2Cyberlibris _uhttps://international.scholarvox.com/netsen/book/88965805 _qtext/html _a |
| 520 | _aAdvanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. - Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda - Present the extension to new failure mechanisms, new technologies, new application fields, new environments - Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities | ||
| 999 |
_c1330837 _d1330837 |
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