000 00440cam a2200145 4500500
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041 _afre
042 _adc
100 1 0 _aHouzet, Dominique
_eauthor
245 0 0 _aMicroprocessors
260 _c2026.
500 _a7
786 0 _nElectronics | - | 2026-03-05 | p. 6-6
856 4 1 _uhttps://stm.cairn.info/digital-circuit-architecture-and-testing--bdti42276210-e3555-page-6?lang=en&redirect-ssocas=7080
999 _c1788391
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