000 02359cam a2200301zu 4500
001 88828631
003 FRCYB88828631
005 20250107213412.0
006 m o d
007 cr un
008 250107s2015 fr | o|||||0|0|||fre d
020 _a9782911256677
035 _aFRCYB88828631
040 _aFR-PaCSA
_bfr
_c
_erda
100 1 _aThomas, Olivier
245 0 1 _aMechanics of nano-objects
_c['Thomas, Olivier', 'Ponchet, Anne', 'Forest, Samuel']
264 1 _bPresses des Mines
_c2015
300 _a p.
336 _btxt
_2rdacontent
337 _bc
_2rdamdedia
338 _bc
_2rdacarrier
650 0 _a
700 0 _aThomas, Olivier
700 0 _aPonchet, Anne
700 0 _aForest, Samuel
856 4 0 _2Cyberlibris
_uhttps://international.scholarvox.com/netsen/book/88828631
_qtext/html
_a
520 _aIn nanoscience, one always has to question how the basic theories we use at the macro- and meso- scales (continuum elasticity and plasticity, etc) apply at the nanometre scale. Studying mechanical properties of nano-size objects also challenges the experimental approaches: how to implement reproducible and controllable mechanical loading? How to measure fields (displacement, stress, strain, etc) with the required nano-resolution? Moreover nanoscience is often tackling the limits of continuum theories and thus simulation is an increasingly important tool to evaluate the different scale transitions needed from atoms to nano-objects. This book provides an updated view of the rapidly growing field of mechanical properties of nano-objects like micropillars, nanowires, nano-particles, nano-precipitates, nano-twins, MEMS, NEMS and structured surfaces, etc. It addresses the theoretical and experimental issues that span the field of mechanics at small dimensions: the fundamentals of continuum mechanics and the mechanics of defects, a general state-of-the-art about modelling and simulation and an overview of the size dependent mechanical properties of nano-objects. Fascinating recent advances are shown in the evaluation of displacement fields at the nano scale by X-ray diffraction and transmission electron microscopy. Examples are given of systems where mastering mechanical properties in small dimensions is key to control the final aimed property (electrical, optical, mechanical, etc).
999 _c63257
_d63257